ABER-Labs
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  • IC Decapsulation
    • Chemical and Laser Decapsulation
    • What is Decapsulation
    • Laser Decap. Equipment
  • FIB Circuit Edit
    • FIB Service
    • What and Why of FIB Circuit Editing
    • FIB Equipment
  • Innovation
    • New Technology of Front Side FIB
  • Contact Us

FIB Equipment

We have the advanced FEI Vectra-IET FIB upgrade, we do FIB circuit editing on most IC package types and up to 8” wafers. The FEI Vectra has a wide range of ion beam currents available from 1pA to 15nA  , and modification capability down to 28nm.

FEI Vectra-IET FIB Specification

  • Ion Column: Visionary, Ga liquid metal
  • Acc. Voltage: 5kV – 50 kV
  • Beam Current: 1.0 pA – 15.0 nA
  • Image Resolution: 5nm
  • Stage: 2-axes 8″ Laser interferometer stage
  • X, Y motion 200 mm
  • Image Rotation 360
  • End Point Detection
  • Stage current end-pointing
  • Gas assisted Etching ( Chlorine, Xenon, Water )
  • Deposition ( Tungsten )
  • Insulator deposition ( Siloxane/TMTCS, Oxygen )
  • Cooper Removal ( CoppeRX )
  • GDS Navigation

 

Our Office

About ABER Labs

We are a engineering service team dedicated to the Failure Analysis, specialize in integrated circuit editing, to work with you in problem analysis and debugging. ABER has been composed of people who have cultivated a culture of personnel integrity, and technical competency in their specialization. They also each are highly skilled and very experienced hands-on engineers, with over 20 years of in-depth expertise and a history of excellence in the analytical laboratory field throughout Silicon Valley.

Contact us here:
service@aber-labs.com

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