ABER-Labs
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  • Mission & Commitment
  • IC Decapsulation
    • Chemical and Laser Decapsulation
    • What is Decapsulation
    • Laser Decap. Equipment
  • FIB Circuit Edit
    • FIB Service
    • What and Why of FIB Circuit Editing
    • FIB Equipment
  • Innovation
    • New Technology of Front Side FIB
  • Contact Us

FIB Service

We provide Focused Ion Beam (FIB) circuit editing services for to help the customer optimize their IC design. Our advanced FEI-IET FIB system with Knights-Camelot software CAD navigation, we can obtain excellent resolution images of metal layers which helps to give a high yield rate of successful circuit edits.

 FIB Service

  • Circuit design analysis
  • Circuit modification
  • Circuit design debugging
  • Circuit design verification
  • Circuit isolation
  • Selective probe pad deposition for mechanical probing

Our Office

About ABER Labs

We are a engineering service team dedicated to the Failure Analysis, specialize in integrated circuit editing, to work with you in problem analysis and debugging. ABER has been composed of people who have cultivated a culture of personnel integrity, and technical competency in their specialization. They also each are highly skilled and very experienced hands-on engineers, with over 20 years of in-depth expertise and a history of excellence in the analytical laboratory field throughout Silicon Valley.

Contact us here:
service@aber-labs.com

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